#### Topic provider

In the past 40 years, the Electronic and Optoelectronic System Research Laboratories undertakes the missions for the researches and developments of Semiconductor, Packaging, LED/OLED/Micro LED, Telecommunications, Flexible Electronics, 3D Imaging, Flexible Display and Transparent Display Application System technologies.

ITRI provides a welcoming work environment that stimulates the full potential of ITRI’s members, allowing them to excel and to perform their best in application-oriented researches. We fully cultivate the capability of independent innovation through participating in international cooperation and academic programs. These collaborative activities are pursued so as to aid in the success of technological incubation and entrepreneur start-ups. We strive to strengthen the technological innovation and value creation ability for Taiwan’s industry in order to remain the competitiveness globally.

#### Introduction

Automated optical inspection (AOI) [1] is an automated visual inspection of printed circuit board (PCB) (or LCD,transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method. It is implemented at many stages through the manufacturing process including bare board inspection, solder paste inspection (SPI), pre-reflow and post-reflow as well as other stages. The Institute of Electronics and Optoelectronics in Industrial Technology Research Institute(ITRI) has spent years on developing flexible displays, hoping to elevate the production quality with AOI technology during the pilot run. This time we have invited experts from different fields to join us, and focus on identifying defect classifications of AOI image data that are offered so as to elevate the identification efficiency of AOI through statistical science.

This is a limited-participation topic. Only the students that take Professor Hsueh-Ting Chu's 2019 summer program may participate.

Reference
[1] https://en.wikipedia.org/wiki/Automated_optical_inspection

#### Activity time

The milestone is set at 23:59:59 on 07/15/2019, with its Private Leaderboard being announced at 00:00:00 on 07/28/2019. The grade would be viewed as a basis for awards. Private Leaderboard will be updated occasionally before the milestone.

#### Evaluation Criteria

After classification models of defect prediction are offered by researchers participating in the issue, the back-end of the system would process them in bathces regularly to calculate the score. Evaluations are conducted by calculating the corresponding accuracy rate of the actual value.

The following is the formula:

$$Accuracy = {\text{Number of correct predictions} \over \text{Number of total predictions}}$$

#### Rules

• The evaluation result would be based on the final version that you upload. If two teams (or more) got the same evaluation scores, the time they upload would determine the ranking.
• If there is cheating or fraud during the activity, the team that cheats will be disqualified from the activity and the vacancy would be filled up by other teams in the ranking order.
• After uploading, the answers of test data would be divided into two parts to calculate the score:
• Before the deadline of the activity: The system refers to partial Ground Truth of test data to examine and calculate the score. The result will be posted on Public Leaderboard as reference for the final score and ranking. This data accounts for 40 percent of the entire test data.
• After the deadline of the activity: The system refers to Ground Truth of the remaining test data to examine and calculate the score. The result will be posted on Public Leaderboard as reference for the final score and ranking.